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Operando Characterizations of Light-Induced Junction Evolution in Perovskite Solar CellsTue May 30 2023
Light-induced performance changes in metal halide perovskite solar cells (PSCs) have been studied intensively over the last decade, but little is known about the variation in microscopic optoelectronic properties of the perovskite heterojunctions in a completed device during operation.*
For the article “Operando Characterizations of Light-Induced Junction Evolution in Perovskite Solar Cells “ Chuanxiao Xiao, Yaxin Zhai, Zhaoning Song, Kang Wang, Changlei Wang, Chun-Sheng Jiang, Matthew C. Beard, Yanfa Yan and Mowafak Al-Jassim combined Kelvin probe force microscopy and transient reflection spectroscopy techniques to spatially resolve the evolution of junction properties during the operation of metal-halide PSCs and study the light-soaking effect.
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Switching spectroscopy piezoresponse force microscopy (SS-PFM) using our platinum coated MikroMasch HQ:NSC18/Pt AFM probesMon May 29 2023


SPHERULITE-LIKE MICROSTRUCTURE OBSERVED FOR SPIN-CAST P(VDF-TRFE) THIN FILMS AND THEIR FERROELECTRIC CHARACTERISTICSThu May 25 2023
Ferroelectric polymer thin films crystallize in different phases and microstructures depending on fabrication conditions such as annealing temperature or layer deposition technique.*
In the article “Spherulite-like microstructure observed for spin-cast P(VDF-TrFE) thin films and their ferroelectric characteristics” Davide Disnan, Jonas Hafner, Michael Schneider and Ulrich Schmid demonstrate how the morphology of spin-cast poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) thin films changes as a function of annealing temperature from rice-like to spherulite-like microstructure, whereas the latter morphology is closer to the crystallization characteristic of poly(vinylidene-fluoride) (PVDF).*
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Quantifying nanoscale forces in dynamic AFM using machine learningMon May 22 2023


Happy birthday, Prof. Gerber!Mon May 15 2023
Happy 81st anniversary to Swiss professor Christoph Gerber, co-inventor of the Atomic Force Microscope and 2016 Kavli Price laureate!


BudgetSensors® Tap190Al-G AFM probe used in a studyTue May 09 2023


Mechanically Compatible Grafts for Aortic Repair Obtained Through Tissue EngineeringTue May 09 2023
- Title: Development and mechanical characterization of decellularized scaffolds for an active aortic graft
- Authors: Francesco Giovanniello, Meisam Asgari, Ivan D. Breslavsky, Giulio Franchini, Gerhard A. Holzapfel, Maryam Tabrizian, Marco Amabili
- Publication: Acta BiomaterialiaPublisher: Elsevier
- Date: 1 April 2023


Correlative Atomic Force Microscopy with our OPUS 240AC-NA AFM probesMon Apr 24 2023


BudgetSensors® ElectriTap190-G AFM probes support the nanoscale mapping of temperature-dependent conductionTue Apr 18 2023


Crystalline Silicon Nanoparticles Size Tailoring to Nanometer ScaleTue Apr 11 2023
- Title: Crystalline silicon nanoparticle formation by tailored plasma irradiation: self-structurization, nucleation and growth acceleration, and size control
- Authors: Choi, Daehan; Kim, Jung Hyung; Kwon, Deuk Chul; Shin, Chae Ho; Rhu, Hyun; Yoon, Euijoon; Lee, Hyo-Chang
- Publication: Nanoscale
- Publisher: The Royal Society of Chemistry
- Date: 16 Jun 2021
https://www.nanotools.com/blog/crystalline-silicon-nanoparticles-size-tailoring-to-nanometer-scale.html
#AFM #metrology #topography #microscopy #nanotechnology #AFMProbes #spm #SPMProbes


OPUS 160AC-NG AFM probesMon Apr 10 2023


An investigation using MagneticMulti75 AFM ProbesMon Apr 03 2023


OPUS 240AC-PP AFM ProbesMon Mar 27 2023


Mr. Daniel Rothhardt from the Institute of Physics and Astronomy at Postdam University won first prize for “Best AFM Picture Prize”Fri Mar 17 2023


NanoAndMoreジャパンは日本応用物理学会 春季学術講演会に出展していますThu Mar 16 2023


MCNT-400: Heavy-Duty 22 nm cylindrical tip for cost-efficient and consistent trench bottom accessThu Mar 16 2023
MCNT-400™: Amorphous CNT solution for demanding depth metrology applications
- Controlled shape:
Precisely controlled length of 400 nm and uniform width of 22 nm - Controlled orientation: 3° or 12°
Tilt compensation within ±0.5° for enhanced access capabilities to bottom trench features - Optimized cantilevers:
Standard with k: 40 N/m, f: 320 KHz
Softer cantilevers for force-controlling scanning modes available upon request - Diamond-like hardness and durability:
Exceptional wear resistance of diamond-like carbon for consistent
performance and reduced cost per measurement - Delivered with TrueDimensions™:
Datasheet for every single probe available online 24/7 via QR code


Mr. Paul Philip Schmidt from the Institute of Physics and Astronomy at Postdam University won the 2nd prize for “Best AFM Picture Prize”Wed Mar 15 2023


NanoAndMore Europe proudly sponsored the “Best #AFM Picture Prize”Tue Mar 14 2023


Albert Einstein, 14 March 1879Tue Mar 14 2023
"Learn from yesterday, live for today, hope for tomorrow. The important thing is not to stop questioning." Albert Einstein, 14 March 1879 – ∞
#AFMProbes #AtomicForceMicroscopy #AlbertEinstein

Last exhibition day at APS Physics March.Fri Mar 10 2023
