Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structuresSun Aug 18 2019
Published new post (Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures) on NANOSENSORS Blog Diamond has a high breakdown field, high carrier mobilities and the highest thermal conductivity. That is why diamond is a promising material for next generation high-power devices such as field effect transistors.* In their paper “Conductive-probe atomic force microscopy and Kelvin-probe force microscopy characterization of OH-terminated diamond (111) surfaces with step-terrace structures”, Masatsugu Nagai, Ryo Yoshida, Tatsuki Yamada, Taira Tabakoya, Christoph E. Nebel, Satoshi Yamasaki, Toshiharu Makino, Tsubasa Matsumoto, Takao Inokuma and Norio Tokuda report about a detailed characterization of OH-terminated diamond (111) surfaces with step-terrace (ST) and bunching-step (BS) regions. In order to obtain the OH-terminated diamond (111) surfaces, they combined three techniques: anisotropic diamond etching by thermochemical reaction between Ni and diamond in high-temperature water vapor, hydrogen plasma treatment24) and water vapor annealing. For characterization of the topography as well as electronic surface properties, atomic force microscopy (AFM), Kelvin-probe force microscopy (KPFM) and conductive-prove AFM (CPAFM) were applied.* They found that the contact potential difference (CPD) and current were highly correlated with the surface topography and concluded that the interface states were generated around steps on the OH-terminated diamond (111) surfaces.* The results presented in this paper indicate that atomically flat diamond surfaces with minimal step densities are required to form ideal MOS structures with minimized interface state densities.* The CPD maps of the OH-terminated diamond (111) surfaces were obtained by the KPFM measurements, using NANOSENSORS™ Platinum Silicide ( PtSi ) AFM probes. * https://www.nanosensors.com/uploads/media/files/0001/05/46425f364ed11a0a90b5c6db11118a319a4b4705.pdf Please have a look at the NANOSENORS blog for the full citation and a direct link to the full article. #KPFM #AtomicForceMicroscopy #ScanningProbeMicroscopy
ChinaNano 2019 Beijing August 17-19, Booth 218Sat Aug 17 2019
New post - ChinaNano 2019 Beijing August 17-19, Booth 218 (https://www.nanoworld.com/blog/chinanano-2019-beijing-august-17-19-booth-218/?utm_source=Facebook&utm_medium=Blog&utm_content=ChinaNano+2019+Beijing+August+17-19%2C+Booth+218&utm_campaign=NanoWorld+Blog) has been published on NanoWorld Blog. To all members of the #AFMcommunity who have also travelled to Beijing to participate in the ChinaNano 2019 conference this week: Welcome at our booth 218 at the ChinaNano 2019! We hope you have some time left to drop in and let us know about the progress of your research. Looking forward to meeting you at the ChinaNano 2019 #nanoscience #materialsresearch #AtomicForceMicroscopy
Meet NANOSENSORS at booth 218 at ChinaNano 2019 Beijing August 17 – 19, 2019Sat Aug 17 2019
Published new post (Meet NANOSENSORS at booth 218 at ChinaNano 2019 Beijing August 17 – 19, 2019) on NANOSENSORS Blog We are at booth 218 at the ChinaNano 2019, the 8th International Conference on Nanoscience and Technology at the Beijing International Convention Center (BICC). We are looking forward to seeing you there! Learn all about NANOSENSORS AFM probes at the ChinaNano 2019 #nanotechnology #nanomaterials #AFMcommunity
Meet NANOSENSORS at booth 218 at ChinaNano 2019 Beijing August 17...Sat Aug 17 2019
We are at booth 218 at the ChinaNano 2019, the 8th International Conference on Nanoscience and Technology at the Beijing International Convention Center (BICC). We are looking forward to seeing you there! Learn all about NANOSENSORS AFM probes at the... #AFMcantilever
#AFMProbes #AFMprobes
NANOSENSORS proudly sponsors Asia-Pacific PFM 2019 workshopMon Aug 12 2019
Published new post (NANOSENSORS proudly sponsors Asia-Pacific PFM 2019 workshop) on NANOSENSORS Blog NANOSENSORS™ is a proud sponsor of the 2019 Asia-Pacific Workshop on Piezoresponse Force Microscopy ( PFM) and Nanoscale Electromechanics of Functional Materials and Electrochemical Systems (Asia-Pacific PFM 2019), which will be held in Seoul, Republic of Korea, from August 11 to 14, 2019. We wish all those members of the #AFMcommunity who are participating this week a successful workshop. In the NANOSENSORS blog you will regularly find references to articles mentioning the use of our AFM probes for Piezoresponse Force Microscopy. You’re welcome to have a look at: https://www.nanosensors.com/blog/tag/pfm/ #PiezoresponseForceMicroscopy #nanoscale #materials
Effect of Staple Age on DNA Origami Nanostructure Assembly and StabilityMon Aug 12 2019
Effect of Staple Age on DNA Origami Nanostructure Assembly and Stability (https://www.nanoworld.com/blog/effect-of-staple-age-on-dna-origami-nanostructure-assembly-and-stability/?utm_source=Facebook&utm_medium=Blog&utm_content=Effect+of+Staple+Age+on+DNA+Origami+Nanostructure+Assembly+and+Stability&utm_campaign=NanoWorld+Blog) has been published on NanoWorld Blog. DNA origami nanostructures are widely employed in various areas of fundamental and applied research. Due to the tremendous success of the DNA origami technique in the academic field, considerable efforts currently aim at the translation of this technology from a laboratory setting to real-world applications, such as nanoelectronics, drug delivery, and biosensing. While many of these real-world applications rely on an intact DNA origami shape, they often also subject the DNA origami nanostructures to rather harsh and potentially damaging environmental and processing conditions.* In their article “Effect of Staple Age on DNA Origami Nanostructure Assembly and Stability” Charlotte Kielar, Yang Xin, Xiaodan Xu, Siqi Zhu, Nelli Gorin , Guido Grundmeier, Christin Möser, David M. Smith and Adrian Keller investigate the effect of long-term storage of the employed staple strands on DNA origami assembly and stability.* Atomic force microscopy (AFM) under liquid and dry conditions was employed to characterize the structural integrity of Rothemund triangles assembled from different staple sets that have been stored at −20 °C for up to 43 months.* NanoWorld Ultra-Short Cantilevers USC-F0.3-k0.3 were the AFM probes that were used for the AFM measurements under liquid conditions.* https://www.nanoworld.com/Ultra-Short-Cantilevers-USC-F0.3-k0.3.html Please have a look at the NanoWorld blog for the full citation and a direct link to the full article. #DNA #nanotechnology #AtomicForceMicroscopy
Nucleation in confinement generates long-range repulsion between rough calcite surfacesMon Aug 05 2019
Nucleation in confinement generates long-range repulsion between rough calcite surfaces on NANOSENSORS™ Blog Fluid-induced alteration of rocks and mineral-based materials often starts at confined mineral interfaces where nm-thick water films can persist even at high overburden pressures and at low vapor pressures. These films enable transport of reactants and affect forces acting between mineral surfaces. However, the feedback between the surface forces and reactivity of confined solids is not fully understood.* In “Nucleation in confinement generates long-range repulsion between rough calcite surfaces» Joanna Dziadkowiec, Bahareh Zareeipolgardani, Dag Kristian Dysthe and Anja Røyne describe how they used the surface forces apparatus (SFA) to follow surface reactivity in confinement and measure nm-range forces between two rough calcite surfaces in NaCl, CaCl2, or MgCl2 solutions with ionic strength of 0.01, 0.1 or 1 M.* Roughness evolution with time of single, unconfined calcite films in salt solutions was analyzed by Atomic Force Microscopy using NANOSENSORS™ uniqprobe qp-SCONT AFM probes to image the surfaces in contact mode.* https://www.nanosensors.com/uniqprobe-uniform-quality-spm-probe-soft-contact-mode-qp-scont Please have a look at the NANOSENSORS™ blog for the full citation and a direct link to the full article. #AtomicForceMicroscopy #ChemicalPhysics #RoughnessCharacterization
The Skeptics' Guide to the UniverseFri Aug 02 2019
Friction is everywhere — from a violinist bowing a string to children skidding down a slide. In the right situation, the ubiquitous force can have big effects: Interleave the pages of two phone books, and the friction between the pages will hold the books together so tightly that they become strong enough to suspend a car above the ground.
Happy Birthday SwitzerlandThu Aug 01 2019
Happy Birthday Switzerland (https://www.nanoworld.com/blog/happy-birthday-switzerland/?utm_source=Facebook&utm_medium=Blog&utm_content=Happy+Birthday+Switzerland&utm_campaign=NanoWorld+Blog) has been published on NanoWorld Blog. It's the Swiss National Holiday today. Have fun everyone!
Happy Swiss National Holiday with Smallest Swiss CrossWed Jul 31 2019
Happy Swiss National Holiday with Smallest Swiss Cross on NANOSENSORS™ Blog Basel University: Smallest Swiss Cross - Made of 20 Single Atoms ( a NANOSENSORS™ PPP-NCL was used for this image) 20 bromine atoms positioned on a sodium chloride surface using the tip of an atomic force microscope at room temperature, creating a Swiss cross with the size of 5.6nm. The structure is stable at room temperature and was achieved by exchanging chlorine with bromine atoms. (Fig: University of Basel, Department of Physics)
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopyMon Jul 29 2019
Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy (https://www.nanoworld.com/blog/ultra-high-resolution-imaging-of-thin-films-and-single-strands-of-polythiophene-using-atomic-force-microscopy/?utm_source=Facebook&utm_medium=Blog&utm_content=Ultra-high+resolution+imaging+of+thin+films+and+single+strands+of+polythiophene+using+atomic+force+microscopy&utm_campaign=NanoWorld+Blog) has been published on NanoWorld Blog. Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM).* In the article “Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy” Vladimir V. Korolkov, Alex Summerfield, Alanna Murphy, David B. Amabilino, Kenji Watanabe, Takashi Taniguchi and Peter H. Beton show that individual thiophene units and the lattice of semicrystalline spin-coated films of polythiophenes (PTs) may be resolved using AFM under ambient conditions through the low-amplitude (≤ 1 nm) excitation of higher eigenmodes of a cantilever.* They authors demonstrate that the use of higher eigenmodes in tapping-mode ambient AFM can be successfully employed to characterize both individual polymer strands down to a single-atom level and also the ordering of a semi-crystalline polymer with technological relevance. The combination of AFM and solution deposition provides a simple and high-resolution approach to characterizing the structure of polymers.* The use of NanoWorld Arrow-UHF high frequency AFM probes at their first eigenmode of ~1.4 MHz is mentioned.* https://www.nanoworld.com/ultra-high-frequency-tapping-mode-afm-tip-arrow-uhf Please have a look at the NanoWorld blogpost for the full citation and a direct link to the full article. #AtomicForceMicroscopy #ImagingTechniques #MolecularSelfAssembly
BudgetSensors® HS or CS calibration grating!Mon Jul 22 2019
Get the most out of your BudgetSensors® HS or CS calibration grating! No surface is ideally smooth at the nanoscale, but that does not mean you cannot achieve highly accurate and precise calibration. Averaging the scan profile over several micrometers significantly improves your system's calibration. Check out our calibration gratings here: https://www.budgetsensors.com/calibration-standards
Ferroelectricity-free lead halide perovskites – NANOSENSORS™Sun Jul 21 2019
Ferroelectricity-free lead halide perovskites on NANOSENSORS Blog. In the recent publication “Ferroelectricity-free lead halide perovskites” Andrés Gómez, Qiong Wang, Alejandro R. Goñi, Mariano Campoy-Quilesa and Antonio Abate describe how they employed direct piezoelectric force microscopy ( DPFM ) to examine whether or not lead halide perovskites exhibit ferroelectricity.* Their article aims to provide a deeper understanding of the fundamental physical properties of the organic–inorganic lead halide perovskites and solves a longstanding dispute about their non-ferroelectric character: an issue of high relevance for optoelectronic and photovoltaic applications.* In the course of their research in which besides using DPFM, they also employed piezoelectric force microscopy ( PFM ) and electrostatic force microscopy ( EFM ), they could demonstrate the non-ferroelectricity of lead halide perovskites. * The PFM images were acquired using a PtIr coated NANOSENSORS PPP-EFM AFM probe. https://www.nanosensors.com/PointProbe-Plus-Electrostatic-Force-Microscopy-PtIr5-Coating-afm-tip-PPP-EFM Please have a look at the NANOSENORS blog for the full citation and a direct link to the full article. #perovskite #photovoltaics #ElectrostaticForceMicroscopy #AFMprobes
Highlights
AFM Probe Focus
best of the best
qp-HBC
uniqprobe™ - HeartBeat Cantilever for ScanAsyst®** and Peak Force Tapping™**
Coating:
Reflective Aluminum
Tip Shape: Circular symmetric
Tip Shape: Circular symmetric
AFM Cantilever:
F
60 kHz
C
0.5 N/m
L
115 µm
ATEC-NC
Tapping Mode AFM Probe with REAL Tip Visibility
Coating:
none
Tip Shape: Visible
Tip Shape: Visible
AFM Cantilever:
F
335 kHz
C
45 N/m
L
160 µm
TESPA
Standard Tapping Mode AFM Probe
Coating:
Reflective Aluminum
Tip Shape: Standard
Tip Shape: Standard
AFM Cantilever:
F
320 kHz
C
42 N/m
L
125 µm
OTESPA
Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever
Coating:
Reflective Aluminum
Tip Shape: Optimized Positioning
Tip Shape: Optimized Positioning
AFM Cantilever:
F
300 kHz
C
26 N/m
L
160 µm
