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AFM Probes Catalog
AFM Info
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Calibration Gratings
Select a category
Calibration Gratings
HOPG
AFM Sample Support and Storage
Conductive Adhesives
Electronic Devices
ESD Kit
Mica Discs
Microscope Slides
Non-Conductive Adhesives
Storage Bags
Tweezers, Grippers
Wafers
Wafer Carrier Trays
Calibration Gratings
TGXYZ02
XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch
Tipcheck AFM Tip Characterizer
Sample for Analyzing AFM Tip Geometry
CS-20NG
XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height
TGXYZ01
XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch
TGXYZ03
XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch
TGX
Grating with Undercut Edge Structures for Lateral Calibration and AFM Tip Aspect Ratio Determination
TGF11
Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment
PA01
AFM Tip Evaluation Sample
HS-20MG
Height Calibration Standard, 20nm
HS-100MG
Height Calibration Standard, 100nm
HS-500MG
Height Calibration Standard, 500nm
IVPS100
AFM Probe Tip characterizer: Improved Vertical Parallel Structure
I2FSR
AFM Probe Tip Characterizer: Line with Sharp, Overhanging Edges
ISNE
AFM Probe Tip characterizer: Sharp Silicon "Nanoedge" with Steep Slope
KPFM & EFM Sample
Sample with Al and Au Line Arrays for KPFM and EFM Tests