Calibration Gratings

Select a category

Calibration Gratings HOPG AFM Sample Support and Storage Conductive Adhesives Electronic Devices ESD Kit Mica Discs Microscope Slides Non-Conductive Adhesives Storage Bags Tweezers, Grippers Wafers Wafer Carrier Trays

Calibration Gratings

Lateral-(xy)-Calibration Standard (2D200)

NANOSENSORS

Lateral-(xy)-Calibration Standard (2D200)

Standard for Precise Lateral Calibration with 200 nm Pitch

TGXYZ02

MikroMasch

XYZ Calibration Grating, 100nm Step Height, 5µm and 10µm Pitch

Tipcheck AFM Tip Characterizer

BudgetSensors

Tipcheck AFM Tip Characterizer

Sample for Analyzing AFM Tip Geometry

CS-20NG

BudgetSensors

XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height

TGXYZ01

MikroMasch

XYZ Calibration Grating, 20nm Step Height, 5µm and 10µm Pitch

TGXYZ03

MikroMasch

XYZ Calibration Grating, 500nm Step Height, 5µm and 10µm Pitch

TGX

MikroMasch

Grating with Undercut Edge Structures for Lateral Calibration and AFM Tip Aspect Ratio Determination

TGF11

MikroMasch

Grating with Trapezoid Structures for Lateral Force Calibration and Scanner Nonlinearity Assessment

PA01

MikroMasch

AFM Tip Evaluation Sample

HS-20MG

BudgetSensors

Height Calibration Standard, 20nm

HS-100MG

BudgetSensors

Height Calibration Standard, 100nm

HS-500MG

BudgetSensors

Height Calibration Standard, 500nm

IVPS100

Team Nanotec

AFM Probe Tip characterizer: Improved Vertical Parallel Structure

I2FSR

Team Nanotec

AFM Probe Tip Characterizer: Line with Sharp, Overhanging Edges

ISNE

Team Nanotec

AFM Probe Tip characterizer: Sharp Silicon "Nanoedge" with Steep Slope

KPFM & EFM Sample

BudgetSensors

KPFM & EFM Sample

Sample with Al and Au Line Arrays for KPFM and EFM Tests