AFM Probes »

ARROW-EFM

Order Code / Price*

Quantity

ARROW-EFM-10 Box of 10 AFM Probes

440 440.00 EUR

Volume Discount Available [?]

ARROW-EFM-20 Box of 20 AFM Probes

792 792.00 EUR

Your volume discount is 88.00 EUR or 10.00%

ARROW-EFM-50 Box of 50 AFM Probes

1754 1754.00 EUR

Your volume discount is 446.00 EUR or 20.30%

ARROW-EFM-W Box of 380 AFM Probes

9401 9401.00 EUR

Your volume discount is 7319.00 EUR or 43.80%

Product availability: On stock

Top view SEM image of ARROW™ AFM cantilever

SEM images of ARROW™ AFM tip

ARROW-EFM

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Arrow

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 240 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

Silicon based beam deflection AFM cantilever for electrostatic force mode. Rectangular AFM cantilever that is shaped like an arrow. PtIr5 coating on both sides. PtIr-coating on both sides. Wide detector side for easy adjustment of the detection system, small width at the AFM tip side reduces damping.

All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.

Additionally, this AFM tip offers an excellent tip radius of curvature.

The unique Arrow™ shape of the cantilever allows easy positioning of the AFM tip on the area of interest.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Arrow

Radius: < 25 nm

AFM Cantilever:

Shape:

Force Constant: 2.8 N/m (1.4 - 5.8 N/m)*

Resonance Frequency: 75 kHz (58 - 97 kHz)*

Length: 240 µm (235 - 245 µm)*

Width: 35 µm (30 - 40 µm)*

Thickness: 3 µm ( 2.5 - 3.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.