Silicon based beam deflection AFM cantilever for electrostatic force mode. Rectangular AFM cantilever that is shaped like an arrow. PtIr5 coating on both sides. PtIr-coating on both sides. Wide detector side for easy adjustment of the detection system, small width at the AFM tip side reduces damping.
All AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip.
Additionally, this AFM tip offers an excellent tip radius of curvature.The unique Arrow™ shape of the cantilever allows easy positioning of the AFM tip on the area of interest.