AFM Probes  »  
 Order
 Request a quote (RFQ)
Order Code / Price*
Quantity
ATEC-FM-10 Box of 10 AFM Probes
384.00 EUR
ATEC-FM-50 Box of 50 AFM Probes
1513.00 EUR
Your volume discount is 407.00 EUR or 21.20%
Product availability: On stock

ATEC-FM

Force Modulation AFM Probe with REAL Tip Visibility

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Visible
AFM Cantilever
F 85 kHz
C 2.8 N/m
L 240 µm
*nominal values
Applications
How to optimize AFM scan parameters gear icon

NANOSENSORS AdvancedTEC™ FM AFM tips are designed for force modulation mode imaging. They feature a tetrahedral AFM tip that protrudes from the very end of the AFM cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the AFM probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the AFM tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the AFM tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

The AFM probe offers unique features:

  • REAL TIP VISIBILITY FROM TOP
  • monolithic silicon
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2.8 N/m (0.7 - 9 N/m)*
  • 85 kHz (50 - 130 kHz)*
  • 240 µm (230 - 250 µm)*
  • 35 µm (30 - 40 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * guaranteed range
    Loading
    nanosensors-logo
    nanoworld-logo
    budgetsensors-logo
    mikromasch-logo
    opus-logo
    sqube-logo
    nanotools-logo