AFM Probes »

CONTPt

Order Code / Price*

Quantity

CONTPt-10 Box of 10 AFM Probes

444 444.00 EUR

Volume Discount Available [?]

CONTPt-20 Box of 20 AFM Probes

797 797.00 EUR

Your volume discount is 91.00 EUR or 10.20%

CONTPt-50 Box of 50 AFM Probes

1757 1757.00 EUR

Your volume discount is 463.00 EUR or 20.90%

CONTPt-W Box of 380 AFM Probes

9525 9525.00 EUR

Your volume discount is 7347.00 EUR or 43.50%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

CONTPt

Electrical, Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: Electrically Conductive
AFM tip shape: Standard

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

NanoWorld Pointprobe® CONT AFM probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.