NanoWorld Pointprobe® NCH AFM probes are designed for non-contact or tapping™ mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
Additionally, this AFM probe offers an excellent tip radius of curvature.
For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm use NanoWorld Pointprobe® type NCLR.
This AFM probe features alignment grooves on the back side of the holder chip.