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Order Code / Price*
NCST-10 Box of 10 AFM Probes
311.00 EUR
NCST-50 Box of 50 AFM Probes
1226.00 EUR
Your volume discount is 329.00 EUR or 21.20%
NCST-W Box of 380 AFM Probes
6528.00 EUR
Your volume discount is 5290.00 EUR or 44.80%
Product availability: On stock


Soft Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Standard
AFM Cantilever
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values
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NanoWorld Pointprobe® NCST AFM probes are designed for non-contact or soft tapping™ mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 150 µm use NanoWorld Pointprobe® type NCL. For standard non-contact / tapping mode application use NanoWorld Pointprobe® type NCH.

This AFM probe features alignment grooves on the back side of the holder chip.

AFM Tip:

  • AFM Cantilever:
  • Beam
  • 7.4 N/m (3 - 16 N/m)*
  • 160 kHz (120 - 205 kHz)*
  • 150 µm (145 - 155 µm)*
  • 27 µm (22 - 32 µm)*
  • 2.8 µm ( 2.3 - 3.3 µm)*
  • * typical range