AFM Probes »

NW-AR5T-NCHR

Order Code / Price*

Quantity

NW-AR5T-NCHR-10 Box of 10 AFM Probes

1335 1335.00 EUR

Volume Discount Available [?]

NW-AR5T-NCHR-20 Box of 20 AFM Probes

2390 2390.00 EUR

Your volume discount is 280.00 EUR or 10.50%

NW-AR5T-NCHR-50 Box of 50 AFM Probes

5269 5269.00 EUR

Your volume discount is 1406.00 EUR or 21.10%

NW-AR5T-NCHR-W Box of 380 AFM Probes

28203 28203.00 EUR

Your volume discount is 22527.00 EUR or 44.40%

Product availability: On stock

SEM image of AR5T tilt compensated high aspect ratio AFM tip

NW-AR5T-NCHR

the industry standard

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: High-Aspect-Ratio

AFM Cantilever

F 330 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

High Aspect Ratio (HAR) AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

High Aspect Ratio NCH type is designend for non-contact- / tapping-mode, high resonance frequency mode. The AR5T type based on the Pointprobe® series.

This type offers unique features: length of the high aspect ratio portio of the tip < 2 μm, typical aspect ratio of this portion in the order of 7:1, half cone angle < 5° of this tip portion. Tilted 13° to the center of the AFM tip axis of the tip for measurements on samples with sidewalls approaching 90°.

Pointprobe® sensors are made from monolithic silicon which is highly doped to dissipate static charge. The are chemically inert and offer a high Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally this AFM probe offers an excellent radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

AFM Tip:

Shape: High-Aspect-Ratio

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape:

Force Constant: 42 N/m (21 - 78 N/m)*

Resonance Frequency: 330 kHz (250 - 390 kHz)*

Length: 125 µm (120 - 130 µm)*

Width: 30 µm (25 - 35 µm)*

Thickness: 4 µm ( 3.5 - 4.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.