AFM probes of the 12 series have 2 silicon nitride AFM cantilevers and AFM tips on a glass holder chip. They are used in soft contact mode applications.
AFM probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the AFM cantilevers and 70 nm Cr-Au coating on the back side of the AFM cantilevers. The resulting AFM tip radius is about 30 nm. The coating may cause AFM cantilever bending within 2°.