AFM Probes » XNC12/Cr-Au

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Order Code / Price*
Quantity
XNC12/Cr-Au-10 Box of 10 AFM Probes
295.00 USD
XNC12/Cr-Au-35 Box of 35 AFM Probes
870.00 USD
Your volume discount is 162.50 USD or 15.70%
XNC12/Cr-Au-70 Box of 70 AFM Probes
1595.00 USD
Your volume discount is 470.00 USD or 22.80%
Product availability: On stock
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XNC12/Cr-Au

AFM Probe with 2 Different Gold Coated Silicon Nitride AFM Cantilevers on One Side of the Chip

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Pyramid
This probe features 4 cantilevers
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
*nominal values

Applications

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AFM probes of the 12 series have 2 silicon nitride AFM cantilevers and AFM tips on each side of the glass holder chip. They are used in soft contact mode applications.

AFM probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the AFM cantilevers and 70 nm Cr-Au coating on the back side of the AFM cantilevers. The resulting AFM tip radius is about 30 nm. The coating may cause AFM cantilever bending within 2°.

Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the back side of the AFM cantilever and 35 nm on the tip side of the AFM cantilever.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A
  • triangle
  • 0.08 N/m
  • 17 kHz
  • 200 µm (190 - 210 µm)*
  • 28 µm (23 - 33 µm)*
  • 500 nm ( 425 - 575 nm)*
  • Cantilever B
  • triangle
  • 0.32 N/m
  • 67 kHz
  • 100 µm (90 - 110 µm)*
  • 13.5 µm (8.5 - 18.5 µm)*
  • 500 nm ( 425 - 575 nm)*
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