AFM probes of the 12 series have 2 silicon nitride AFM cantilevers and AFM tips on each side of the glass holder chip. They are used for soft contact mode applications.
AFM probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the AFM cantilever and 70 nm Cr-Au coating on the back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm. The coating may cause AFM cantilever bending within 2°.