Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.
Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.
This product features alignment grooves on the back side of the holder chip.