AFM Probes » XNC12/Cr-Au

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XNC12/Cr-Au-10 Box of 10 AFM Probes
295.00 USD
Volume Discount Available [?]
XNC12/Cr-Au-35 Box of 35 AFM Probes
870.00 USD
Your volume discount is 162.50 USD or 15.70%
XNC12/Cr-Au-70 Box of 70 AFM Probes
1 595.00 USD
Your volume discount is 470.00 USD or 22.80%
Product availability: On stock
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XNC12/Cr-Au

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip

Coating: (Au) Overall
Tip shape: Pyramid
This probe features 4 cantilevers
F 17 kHz
C 0.08 N/m
L 200 µm
F 67 kHz
C 0.32 N/m
L 100 µm
*nominal values

Applications

Probes of the 12 series have 2 silicon nitride cantilevers and tips on each side of the glass holder chip. They are used for soft contact mode applications.

Probes with a conductive, chemically inert 35 nm Cr-Au coating on the tip side of the cantilever and 70 nm Cr-Au coating on the back side of the cantilever. Resulting tip radius is about 30 nm. The coating may cause cantilever bending within 2°.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as an Au film on a Cr sublayer, which is deposited for better adhesion of Au. The coating thickness is 70 nm on the backside of the cantilever and 35 nm on the tipside of the cantilever.

AFM Tip:


  • 4 AFM Cantilevers:

    Cantilever A
  • triangular
  • 0.08 N/m
  • 17 kHz
  • 200 µm (190 - 210 µm)*
  • 28 µm (23 - 33 µm)*
  • 500 nm
  • Cantilever B
  • triangular
  • 0.32 N/m
  • 67 kHz
  • 100 µm (90 - 110 µm)*
  • 13.5 µm (8.5 - 18.5 µm)*
  • 500 nm
  • * typical range
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