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Order Code / Price*
ZEILR-10 Box of 10 AFM Probes
311.00 EUR
ZEILR-50 Box of 50 AFM Probes
1226.00 EUR
Your volume discount is 329.00 EUR or 21.20%
ZEILR-W Box of 380 AFM Probes
6528.00 EUR
Your volume discount is 5290.00 EUR or 44.80%
Product availability: On stock


Special Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard
AFM Cantilever
F 27 kHz
C 1.6 N/m
L 450 µm
*nominal values
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NanoWorld Pointprobe® ZEILR AFM probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode AFM probes of the CONT type the force constant is slightly increased.

The AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 1.6 N/m (1 - 2.6 N/m)*
  • 27 kHz (23 - 31 kHz)*
  • 450 µm (445 - 455 µm)*
  • 55 µm (50 - 60 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range