NanoWorld Pointprobe® ZEILR AFM probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode AFM probes of the CONT type the force constant is slightly increased.
The AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
Additionally, this AFM probe offers an excellent tip radius of curvature.