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HQ:NSC15/Pt-15 Box of 15 AFM Probes
395.00 EUR
HQ:NSC15/Pt-50 Box of 50 AFM Probes
1120.00 EUR
Your volume discount is 196.67 EUR or 14.90%
HQ:NSC15/Pt-100 Box of 100 AFM Probes
2050.00 EUR
Your volume discount is 583.33 EUR or 22.20%
Product availability: On stock
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Electrical, Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 325 kHz
C 40 N/m
L 125 µm
*nominal values
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AFM cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also suitable for non-contact mode.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

This AFM probe features alignment grooves on the back side of the holder chip.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (27 - 33 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range