AFM Probes » HQ:NSC15/Pt

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HQ:NSC15/Pt-15 Box of 15 AFM Probes
360.00 USD 306.00 USD
Volume Discount Available [?]
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HQ:NSC15/Pt-50 Box of 50 AFM Probes
900.00 USD 765.00 USD
Your volume discount is 255.00 USD or 25.00%
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HQ:NSC15/Pt-100 Box of 100 AFM Probes
1 620.00 USD 1 377.00 USD
Your volume discount is 663.00 USD or 32.50%
Product availability: On stock
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HQ:NSC15/Pt

Electrical, Tapping Mode AFM Probe

Manufacturer: MikroMasch

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 325 kHz
C 40 N/m
L 125 µm
*nominal values

Applications

How to optimize AFM scan gear icon

AFM cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when the high topographic and phase contrast are necessary. The 15 series is also suitable for non-contact mode.

AFM probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conductive Pt coating is continuous from the tip end to the bulk of the silicon chip. The coating covers both the tip and the back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 80 N/m)*
  • 325 kHz (265 - 410 kHz)*
  • 125 µm (120 - 130 µm)*
  • 30 µm (27 - 33 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range
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