AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.
They are not designed as dedicated ScanAsyst®** mode AFM probes, but they have been confirmed as compatible with Bruker ScanAsyst® PeakForce Tapping™** mode by many customers all over the world.
This AFM probe features alignment grooves on the back side of the holder chip.
