AFM Probes » HQ:NSC19/Cr-Au

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HQ:NSC19/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:NSC19/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC19/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC19/Cr-Au

Gold Coated Force Modulation AFM Probe

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
AFM Cantilever
F 65 kHz
C 0.5 N/m
L 125 µm
*nominal values

Applications

How to optimize AFM scan gear icon

AFM cantilevers of the 19 series combine the high frequency and low force constant, which makes them suitable for imaging soft and fragile surfaces at a relatively high speed in Tapping mode. They are compatible with Bruker ScanAsyst® PeakForce Tapping™*. These AFM cantilevers are also used for Lateral force microscopy LFM due to their high sensitivity to the lateral forces.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.5 N/m (0.05 - 2.3 N/m)*
  • 65 kHz (25 - 120 kHz)*
  • 125 µm (120 - 130 µm)*
  • 22.5 µm (19.5 - 25.5 µm)*
  • 1 µm ( 0.5 - 1.5 µm)*
  • * typical range
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