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Order Code / Price*
160AC-NN-10 Box of 10 AFM Probes
295.00 EUR
160AC-NN-50 Box of 50 AFM Probes
1100.00 EUR
Your volume discount is 375.00 EUR or 25.40%
160AC-NN-100 Box of 100 AFM Probes
1880.00 EUR
Your volume discount is 1070.00 EUR or 36.30%
Product availability: On stock
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Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Manufacturer: OPUS by MikroMasch

Coating: none
AFM tip shape: Optimized Positioning
AFM Cantilever
F 300 kHz
C 26 N/m
L 160 µm
*nominal values
How to optimize AFM scan parameters gear icon

The 160AC series of AFM probes is designed for standard tapping or non-contact mode AFM imaging in air or vacuum.

The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

This AFM probe features alignment grooves on the back side of the holder chip.

AFM Tip:

  • AFM Cantilever:
  • Beam
  • 26 N/m (8 - 57 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 160 µm (150 - 170 µm)*
  • 40 µm (38 - 42 µm)*
  • 4 µm ( 3.5 - 4.5 µm)*
  • * typical range