The 160AC series of AFM probes is designed for standard tapping or non-contact mode AFM imaging in air or vacuum.
The uncoated AFM probe offers a sharp AFM tip apex, chemical inertness and a high AFM cantilever quality factor.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
This AFM probe features alignment grooves on the back side of the holder chip.