AFM Probes »

CONTR

Order Code / Price*

Quantity

CONTR-10 Box of 10 AFM Probes

311 311.00 EUR

Volume Discount Available [?]

CONTR-20 Box of 20 AFM Probes

556 556.00 EUR

Your volume discount is 66.00 EUR or 10.60%

CONTR-50 Box of 50 AFM Probes

1226 1226.00 EUR

Your volume discount is 329.00 EUR or 21.20%

CONTR-W Box of 380 AFM Probes

6528 6528.00 EUR

Your volume discount is 5290.00 EUR or 44.80%

Product availability: On stock

SEM image of PointProbe® Plus AFM tip

CONTR

Name: CONTR-10 Standard Contact Mode AFM Probe
Brand: NanoWorld
SKU: CONTR-10
Price: 311 EUR
Availability: InStock

the industry standard

Standard Contact Mode AFM Probe

Manufacturer: NanoWorld

Coating: Reflective Aluminum
AFM tip shape: Standard

AFM Cantilever

F 13 kHz

C 0.2 N/m

L 450 µm

*nominal values

Applications

Contact Mode AFM Probes

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

How to use standard AFM Probes on Park AFM Systems

NanoWorld Pointprobe® CONT AFM probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

Radius: < 8 nm (< 12 nm guaranteed)

AFM Cantilever:

Shape: Beam

Force Constant: 0.2 N/m (0.07 - 0.4 N/m)*

Resonance Frequency: 13 kHz (9 - 17 kHz)*

Length: 450 µm (445 - 455 µm)*

Width: 50 µm (45 - 55 µm)*

Thickness: 2 µm ( 1.5 - 2.5 µm)*

* typical range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.