NanoWorld Pointprobe® CONT AFM probes are designed for contact mode imaging. Furthermore this AFM probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.
Additionally, this AFM probe offers an excellent tip radius of curvature.