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NW-SSS-SEIH-10 Box of 10 AFM Probes
741.00 EUR
NW-SSS-SEIH-20 Box of 20 AFM Probes
1328.00 EUR
Your volume discount is 154.00 EUR or 10.40%
NW-SSS-SEIH-50 Box of 50 AFM Probes
2928.00 EUR
Your volume discount is 777.00 EUR or 21.00%
Product availability: On stock


SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 130 kHz
C 15 N/m
L 225 µm
*nominal values
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NanoWorld Pointprobe® SEIHR AFM probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip. 

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

AFM Tip:

  • AFM Cantilever:
  • Beam
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • 225 µm (220 - 230 µm)*
  • 33 µm (27.5 - 37.5 µm)*
  • 5 µm ( 4.5 - 5.5 µm)*
  • * typical range