AFM Probes »

NW-SSS-SEIH

Order Code / Price*

Quantity

NW-SSS-SEIH-10 Box of 10 AFM Probes

810 810.00 USD

Volume Discount Available [?]

NW-SSS-SEIH-20 Box of 20 AFM Probes

1433 1433.00 USD

Your volume discount is 187.00 USD or 11.50%

NW-SSS-SEIH-50 Box of 50 AFM Probes

3161 3161.00 USD

Your volume discount is 889.00 USD or 22.00%

Product availability: On stock

SEM images of SuperSharpSilicon™ (SSS) AFM tip

NW-SSS-SEIH

Name: NW-SSS-SEIH
Brand: NanoWorld

SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Supersharp

AFM Cantilever

F 130 kHz

C 15 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

NanoWorld Pointprobe® SEIHR AFM probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

Additionally, this AFM probe offers an excellent tip radius of curvature.

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:

Shape: Supersharp

Radius: < 2 nm (< 5 nm guaranteed)

Half Cone Angle: < 10° at 200 nm from apex

AFM Cantilever:

Shape: Beam

Force Constant: 15 N/m (9 - 25 N/m)*

Resonance Frequency: 130 kHz (110 - 150 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 33 µm (27.5 - 37.5 µm)*

Thickness: 5 µm ( 4.5 - 5.5 µm)*

* typical range