AFM Probes » NW-SSS-SEIH

Order Code / Price*

Quantity

NW-SSS-SEIH-10 Box of 10 AFM Probes

699 699.00 USD

Volume Discount Available [?]

NW-SSS-SEIH-20 Box of 20 AFM Probes

1252 1 252.00 USD

Your volume discount is 146.00 USD or 10.40%

NW-SSS-SEIH-50 Box of 50 AFM Probes

2762 2 762.00 USD

Your volume discount is 733.00 USD or 21.00%

Product availability: On stock

NW-SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Coating: none
Tip shape: Supersharp

Cantilever:

F 130 kHz

C 15 N/m

L 225 µm

*nominal values

Applications

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:

Shape: Supersharp

Radius: < 2 nm (< 5 nm guaranteed)

Half Cone Angle: < 10° at 200 nm from apex

AFM Cantilever:

Shape: Beam

Force Constant: 15 N/m (9 - 25 N/m)*

Resonance Frequency: 130 kHz (110 - 150 kHz)*

Length: 225 µm (220 - 230 µm)*

Width: 33 µm (27.5 - 37.5 µm)*

Thickness: 5 µm (4.5 - 5.5 µm)*

* typical range

AFM Probes » NW-SSS-SEIH

NW-SSS-SEIH