AFM Probes » NW-SSS-SEIH

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NW-SSS-SEIH-10 Box of 10 AFM Probes
699.00 USD 594.00 USD
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NW-SSS-SEIH-20 Box of 20 AFM Probes
1 252.00 USD 1 064.00 USD
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NW-SSS-SEIH-50 Box of 50 AFM Probes
2 762.00 USD 2 347.00 USD
Your volume discount is 623.00 USD or 21.00%
Product availability: On stock

NW-SSS-SEIH

SuperSharp, Special Tapping Mode AFM Probe

Manufacturer: NanoWorld

Coating: none
AFM tip shape: Supersharp
AFM cantilever:
F 130 kHz
C 15 N/m
L 225 µm
*nominal values

Applications

NanoWorld Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip. 

Additionally, this probe offers an excellent tip radius of curvature.

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 15 N/m (9 - 25 N/m)*
  • 130 kHz (110 - 150 kHz)*
  • 225 µm (220 - 230 µm)*
  • 33 µm (27.5 - 37.5 µm)*
  • 5 µm ( 4.5 - 5.5 µm)*
  • * typical range
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