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Order Code / Price*
Quantity
SSS-NCH-10 Box of 10 AFM Probes
776.00 EUR
SSS-NCH-50 Box of 50 AFM Probes
3060.00 EUR
Your volume discount is 820.00 EUR or 21.10%
Product availability: On stock

SSS-NCH

SuperSharp, Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: none
AFM tip shape: Supersharp
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values
Applications
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NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ AFM tip with unrivalled sharpness.

The AFM probe offers unique features:

  • excellent AFM tip radius of curvature
  • typical aspect ratio at 200 nm from AFM tip apex in the order of 4:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

Uncoated
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range
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