AFM Probes » SSS-NCH

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Order Code / Price*
Quantity
SSS-NCH-10 Box of 10 AFM Probes
757.00 USD
SSS-NCH-50 Box of 50 AFM Probes
2 988.00 USD
Your volume discount is 797.00 USD or 21.10%
Product availability: On stock

SSS-NCH

SuperSharp, Tapping Mode AFM Probe

Coating: none
Tip shape: Supersharp
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
*nominal values

Applications

NANOSENSORS™ SSS-NCH AFM probes are designed for non-contact mode or tapping mode AFM.

For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.

The probe offers unique features:

  • excellent tip radius of curvature
  • typical aspect ratio at 200 nm from tip apex in the order of 4:1
  • monolithic material
  • highly doped silicon to dissipate static charge
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Uncoated

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (30 - 45 µm)*
  • 4 µm (3 - 5 µm)*
  • * typical range
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