AFM probes are designed for non-contact mode or tapping mode AFM.
For enhanced resolution of nanostructures and microroughness we offer our SuperSharpSilicon™ tip with unrivalled sharpness.
The probe offers unique features:
- excellent tip radius of curvature
- typical aspect ratio at 200 nm from tip apex in the order of 4:1
- monolithic material
- highly doped silicon to dissipate static charge
- chemically inert
- high mechanical Q-factor for high sensitivity