315 µm Thick AFM Support Chips

SSS-MFMR

SuperSharp, Hard Magnetic, Low Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Supersharp

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

the industry standard

MFMR

Hard Magnetic, Medium Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

S-MFMR

Soft Magnetic, Medium Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Standard

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

top value

HQ:NSC18/Co-Cr/Al BS

Hard Magnetic, Medium Momentum MFM AFM Probe

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

2.8 N/m

L

225 µm

HQ:NSC36/Co-Cr/Al BS

Hard Magnetic, Medium Momentum MFM AFM Probe with 3 Different AFM Cantilevers

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilevers: 3

1

2

3

F

60 kHz

130 kHz

65 kHz

C

1 N/m

2 N/m

0.6 N/m

L

110 µm

90 µm

130 µm

top value

240AC-MA

Hard Magnetic, Medium Momentum AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: Magnetic
Tip Shape: Optimized Positioning

AFM Cantilever:

F

70 kHz

C

2 N/m

L

240 µm

best bang for your buck

MagneticMulti75-G

Hard Magnetic, Medium Momentum AFM Probe

Coating: Magnetic
Tip Shape: Rotated

AFM Cantilever:

F

75 kHz

C

3 N/m

L

225 µm

PPP-NCH

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

330 kHz

C

42 N/m

L

125 µm

PPP-NCL

Tapping Mode AFM Probe, Long AFM Cantilever

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NCH

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

TESP

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

320 kHz

C

42 N/m

L

125 µm

ARROW-NC

Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: none
Tip Shape: Arrow

AFM Cantilever:

F

285 kHz

C

42 N/m

L

160 µm

LTESP

Tapping Mode AFM Probe, Long Cantilever

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

NCL

Tapping Mode AFM Probe, Long Cantilever

Coating: none
Tip Shape: Standard

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm

HQ:NSC15/No Al

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

325 kHz

C

40 N/m

L

125 µm

HQ:NSC16/No Al

Tapping Mode AFM Probe with Long AFM Cantilever

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

45 N/m

L

225 µm

top value

3XC-NA

AFM Probe with 3 Different AFM Cantilevers for Various Applications and AFM  Tips at the Very End of the AFM Cantilevers

Coating: Reflective Aluminum
Tip Shape: Optimized Positioning

AFM Cantilevers: 3

1

2

3

F

17 kHz

150 kHz

75 kHz

C

0.3 N/m

9 N/m

2.5 N/m

L

500 µm

175 µm

240 µm

160AC-NN

Standard Tapping Mode AFM Probe with AFM Tip at the Very End of the AFM Cantilever

Coating: none
Tip Shape: Optimized Positioning

AFM Cantilever:

F

300 kHz

C

26 N/m

L

160 µm

Tap300-G

Standard Tapping Mode AFM Probe

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

300 kHz

C

40 N/m

L

125 µm

Tap190-G

Tapping Mode AFM Probe with Long AFM Cantilever

Coating: none
Tip Shape: Rotated

AFM Cantilever:

F

190 kHz

C

48 N/m

L

225 µm