Product » SEM-H-CT-32-12-AD90

SEM-H-CT-32-12-AD90

Hitachi Ø32x12mm M4 angled SEM sample stub, double 90°, aluminum

Product Description

Angled Hitachi stubs to quickly image samples at 45° or 90° pre-tilt w/o using tilt on the sample stage. 32mm with double 90°.
Loading
nanosensors-logo
nanoworld-logo
budgetsensors-logo
mikromasch-logo
opus-logo
nanotools-logo