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Valid Until: 30.09.2021

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The most consistent quality from the technology leader in AFM probes year by year, batch by batch, wafer by wafer, probe by probe.

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NanoWorld Ultra-Short Cantilevers (USC)

Your solution for High Speed AFM with resonance frequencies of up to 5 MHz

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Non-Contact / Tapping Mode AFM Probes

General dynamic mode measurements

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Force Modulation (FM) AFM Probes

Multi-functional probes

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Contact Mode AFM Probes

General static mode measurements

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Life Science AFM Probes

Biological applications

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Ultra High Frequency AFM Probes

High speed measurements

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Conductive AFM Probes

Electrical characterization (EFM, KPFM, SSRM, TUNA, etc.)

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Magnetic AFM Probes

Magnetic force microscopy (MFM)

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Supersharp AFM Probes

Enhanced / atomic resolution measurements

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Diamond AFM Probes

The ultimate in hardness

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Hardened / Enhanced Wear Resistance AFM Probes

Long scanning, hard samples

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Nanoindentation and Lithography AFM Probes

Nanomechanics and Sample Modification

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High Aspect Ratio (HAR) AFM Probes

Deep trench measurements

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ScanAsyst®** AFM Probes

ScanAsyst® compatible probes

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Silicon Nitride AFM Probes

Soft samples in air and liquid

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Lateral Force Microscopy (LFM) AFM Probes

Frictional force measurements

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Tipless AFM Cantilevers and Cantilever Arrays

For functionalization and gluing spheres

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Colloidal AFM Probes

Various colloidal sphere-tips for nanomechanics

Self-Sensing & Self-Actuating AFM Probes

The AFM technology of tomorrow

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Sphere AFM Tips

Well defined sphere geometry for nanomechanics

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Platinum Silicide AFM Probes

The ultimate probes for electrical characterization

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Scanning Thermal Microscopy AFM Probes

Temperature and thermal conductivity measurements

Premounted AFM Probes

For Quesant / Ambios AFM systems

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