Conductive AFM Probes

CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 105 kHz

C 6.2 N/m

L 225 µm

CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 20 kHz

C 0.5 N/m

L 450 µm

PPP-EFM

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

ATEC-EFM

Electrical, Force Modulation AFM Probe with REAL Tip Visibility

Coating: Electrically Conductive
Tip Shape: Visible

Cantilever:

F 85 kHz

C 2.8 N/m

L 240 µm

PtSi-FM

Electrical, Force Modulation AFM Probes

Coating: Platinum Silicide Overall
Tip Shape: Standard

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

Special Developments

Download a List of Non-Standard, Special AFM Probes and More

Coating: various
Tip Shape: various

PtSi-CONT

Electrical, Contact Mode AFM Probes

Coating: Platinum Silicide Overall
Tip Shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

NW-CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 105 kHz

C 6.2 N/m

L 225 µm

ARROW-EFM

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: Arrow

Cantilever:

F 75 kHz

C 2.8 N/m

L 240 µm

EFM

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Standard

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

DDESP-FM

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond
Tip Shape: Standard

Cantilever:

F 105 kHz

C 6.2 N/m

L 225 µm

DDESP

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond
Tip Shape: Standard

Cantilever:

F 400 kHz

C 80 N/m

L 125 µm

HQ:NSC18/Pt

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

Cantilever:

F 75 kHz

C 2.8 N/m

L 225 µm

240AC-PP

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: OPUS

Cantilever:

F 70 kHz

C 2 N/m

L 240 µm

ElectriMulti75-G

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated

Cantilever:

F 75 kHz

C 3 N/m

L 225 µm

OSCM-PT

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Coating: Electrically Conductive
Tip Shape: OPUS

Cantilever:

F 70 kHz

C 2 N/m

L 240 µm

PtSi-NCH

Electrical, Tapping Mode AFM Probes

Coating: Platinum Silicide Overall
Tip Shape: Standard

Cantilever:

F 330 kHz

C 42 N/m

L 125 µm

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 400 kHz

C 80 N/m

L 125 µm

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 210 kHz

C 72 N/m

L 225 µm

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard

Cantilever:

F 400 kHz

C 80 N/m

L 125 µm