Conductive AFM Probes

82 results matching your criteria
CDT-FMR

CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
CDT-CONTR

CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 20 kHz
C 0.5 N/m
L 450 µm
PPP-EFM

PPP-EFM

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
ATEC-EFM

ATEC-EFM

Electrical, Force Modulation AFM Probe with REAL Tip Visibility
Coating: Electrically Conductive
Tip Shape: Visible
Cantilever:
F 85 kHz
C 2.8 N/m
L 240 µm
PtSi-FM

PtSi-FM

Electrical, Force Modulation AFM Probes
Coating: Platinum Silicide Overall
Tip Shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
Special Developments

Special Developments

Download a List of Non-Standard, Special AFM Probes and More
Coating: various
Tip Shape: various
PtSi-CONT

PtSi-CONT

Electrical, Contact Mode AFM Probes
Coating: Platinum Silicide Overall
Tip Shape: Standard
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
NW-CDT-FMR

NW-CDT-FMR

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
ARROW-EFM

ARROW-EFM

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: Arrow
Cantilever:
F 75 kHz
C 2.8 N/m
L 240 µm
EFM

EFM

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Standard
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
DDESP-FM

DDESP-FM

Diamond Coated, Conductive Force Modulation AFM Probe

Coating: Diamond
Tip Shape: Standard
Cantilever:
F 105 kHz
C 6.2 N/m
L 225 µm
DDESP

DDESP

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond
Tip Shape: Standard
Cantilever:
F 400 kHz
C 80 N/m
L 125 µm
HQ:NSC18/Pt

HQ:NSC18/Pt

Electrical, Force Modulation AFM Probe
Coating: Electrically Conductive
Tip Shape: Rotated
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
240AC-PP

240AC-PP

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
ElectriMulti75-G

ElectriMulti75-G

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip Shape: Rotated
Cantilever:
F 75 kHz
C 3 N/m
L 225 µm
OSCM-PT

OSCM-PT

Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Electrically Conductive
Tip Shape: OPUS
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
PtSi-NCH

PtSi-NCH

Electrical, Tapping Mode AFM Probes
Coating: Platinum Silicide Overall
Tip Shape: Standard
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
CDT-NCHR

CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 400 kHz
C 80 N/m
L 125 µm
CDT-NCLR

CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever
Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 210 kHz
C 72 N/m
L 225 µm
NW-CDT-NCHR

NW-CDT-NCHR

Diamond Coated, Conductive Tapping Mode AFM Probe

Coating: Diamond,Conductive Diamond
Tip Shape: Standard
Cantilever:
F 400 kHz
C 80 N/m
L 125 µm
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