Contact Mode AFM Probes

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PPP-CONTR

Standard Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

ATEC-CONT

Contact Mode AFM Probe with REAL Tip Visibility

Coating: none
Tip Shape: Visible

Cantilever:

F 15 kHz

C 0.2 N/m

L 450 µm

PPP-XYCONTR

Contact Mode AFM Probe with Special Alignment System

Coating: Reflex Aluminum
Tip Shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

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CONTR

Standard Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: Standard

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

ARROW-CONTR

Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Coating: Reflex Aluminum
Tip Shape: Arrow

Cantilever:

F 14 kHz

C 0.2 N/m

L 450 µm

HQ:CSC17/Al BS

Standard Contact Mode AFM Probe

Coating: none
Tip Shape: Rotated

Cantilever:

F 13 kHz

C 0.18 N/m

L 450 µm

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ContAl-G

Standard Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

qp-BioAC-CI

uniqprobe™ BioAC with Rounded Tips for Cell Imaging

Coating: Reflex (Au)
Tip Shape: Circular symmetric

Cantilevers: 3

F 90 kHz

C 0.3 N/m

L 40 µm

F 50 kHz

C 0.1 N/m

L 60 µm

F 30 kHz

C 0.06 N/m

L 80 µm

USC-F1.2-k0.15

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflex (Au)
Tip Shape: Cone Shaped,EBD

Cantilever:

F 1200 kHz

C 0.15 N/m

L 7 µm

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PNP-TR

Silicon Nitride AFM Probe

Coating: Reflex (Au)
Tip Shape: Pyramid

Cantilevers: 4

F 67 kHz

C 0.32 N/m

L 100 µm

F 17 kHz

C 0.08 N/m

L 200 µm

qp-BioT

uniqprobe™ - uniform quality SPM probe for non-contact/tapping mode/contact mode with 2 different triangular cantilevers

Coating: Reflex (Au)
Tip Shape: Circular symmetric

Cantilevers: 2

F 50 kHz

C 0.3 N/m

L 100 µm

F 20 kHz

C 0.08 N/m

L 200 µm

Special Developments

Not available in the standard scope of products

Coating: various
Tip Shape: various

PPP-CONTSCR

Contact Mode AFM Probe with Short Cantilever

Coating: Reflex Aluminum
Tip Shape: Standard

Cantilever:

F 25 kHz

C 0.2 N/m

L 225 µm

PPP-RT-CONTR

Standard Contact Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilever:

F 13 kHz

C 0.2 N/m

L 450 µm

USC-F0.3-k0.3

Ultra-Short Cantilever (USC) mainly dedicated to High-Speed AFM applications in liquid

Coating: Reflex (Au)
Tip Shape: Cone Shaped,EBD

Cantilever:

F 300 kHz

C 0.3 N/m

L 20 µm

PNP-DB

Silicon Nitride AFM Probe

Coating: Reflex (Au)
Tip Shape: Pyramid

Cantilevers: 4

F 67 kHz

C 0.48 N/m

L 100 µm

F 17 kHz

C 0.06 N/m

L 200 µm

New

XNC12/Cr-Au BS

AFM Probe with 2 Different Gold Coated Silicon Nitride Cantilevers on Each Side of the Chip

Coating: Reflex (Au)
Tip Shape: Pyramid

Cantilevers: 4

F 17 kHz

C 0.08 N/m

L 200 µm

F 67 kHz

C 0.32 N/m

L 100 µm

HQ:XSC11/Al BS

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 4

F 15 kHz

C 0.2 N/m

L 500 µm

F 80 kHz

C 2.7 N/m

L 210 µm

F 155 kHz

C 7 N/m

L 150 µm

F 350 kHz

C 42 N/m

L 100 µm

PNP-TRS

Silicon Nitride AFM Probe Single Cantilever Compatible with ScanAsyst® Mode

Coating: Reflex (Au)
Tip Shape: Pyramid

Cantilever:

F 67 kHz

C 0.32 N/m

L 100 µm

All-In-One-Al

AFM Probe with 4 Different Cantilevers for Various Applications

Coating: Reflex Aluminum
Tip Shape: Rotated

Cantilevers: 4

F 15 kHz

C 0.2 N/m

L 500 µm

F 80 kHz

C 2.7 N/m

L 210 µm

F 150 kHz

C 7.4 N/m

L 150 µm

F 350 kHz

C 40 N/m

L 100 µm