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MikroMasch AFM nanolithography and topography measurements

MikroMasch® HQ:NSC16 series AFM probes used in a recently published workMon Nov 15 2021

Our HQ:NSC16 series AFM probes are used for AFM nanolithography and topography measurements in this recently published work on next-generation sustainable data storage materials based on metal-organic frameworks (MOFs).

https://onlinelibrary.wiley.com/action/downloadSupplement?doi=10.1002%2Fadmi.202101196&file=admi202101196-sup-0001-SuppMat.pdf&fbclid=IwAR0ddmZrTxBlUNrr44B1KKrL3QC7Nm7Iktmf_VlbHfuUiip2DBdFmRwW17M

BudgetSensors Happy World Science Day for Peace and Development! - news

Happy World Science Day for Peace and Development!Wed Nov 10 2021

“Celebrated every 10 November, World Science Day for Peace and Development highlights the important role of science in society and the need to engage the wider public in debates on emerging scientific issues. It also underlines the importance and relevance of science in our daily lives.”

MikroMasch MikroMasch® thanks Ernest Rutherford for his experiment. - news

MikroMasch® thanks Ernest Rutherford for his experiment.Mon Aug 30 2021

On this day in 1871 Ernest Rutherford, the father of nuclear physics, was born. Thanks to the Rutherford gold foil experiment we know that atoms have very small nuclei, where most of their mass is concentrated, surrounded by orbiting electrons.
Do we measure the atomic nuclei with atomic resolution Atomic Force Microscopy?

BudgetSensors Happy birthday to Gerd Binnig! - news

Happy birthday to Gerd Binnig!Tue Jul 20 2021

Quite often decades pass between an important discovery in natural sciences and its respective Nobel Prize. Not so with the discovery of the Scanning Tunneling Microscope in 1981, which earned its inventors half of the 1986 Nobel Prize. Happy birthday to Gerd Binnig, co-inventor of the Scanning Tunneling Microscope and the Atomic Force Microscope!

NanoWorld Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopy - news

Quantification of electron accumulation at grain boundaries in perovskite polycrystalline films by correlative infrared-spectroscopic nanoimaging and Kelvin probe force microscopyTue May 25 2021

Organic-inorganic halide perovskites are materials of high interest for the development of solar cells. Learning more about the relationship between the electrical properties and the chemical compositions of perovskite at the nanoscale can help to understand how the interrelations of both can affect device performance and contribute to an understanding on how to best design … Continue reading

NANOSENSORS Temperature effects on the nano-friction across exposed atomic step edges - news

Temperature effects on the nano-friction across exposed atomic step edgesThu May 20 2021

In the article “Temperature effects on the nano-friction across exposed atomic step edges” Wen Wang, Ashu Wang and Lingyan Zeng describe how they used friction force microscopy ( FFM ) under ultrahigh vacuum ( UHV) conditions to study the temperature dependence of nanoscale friction between a silicon AFM tip ( NANOSENSORS™ PointProbe® Plus PPP-LFMR AFM […]



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