AFM probes with very short, narrow and thin cantilevers with Electron Beam Deposited AFM tips for High Speed Scanning.
AFM probe for measuring electro-chemical reactions such as redox reactions, corrosion and dissolution of materials.
Tip: Silicon / SiO2 / Pt / SiN
Cantilevers: Silicon / SiO2 / Pt / SiN
Tip radius of curvature < 40 nm
AFM probe that requires neither an external piezo actuator, nor optical detection.
AFM probe showing an AFM cantilever with an integrated resistance thermometer for thermal mapping in contact mode.
AFM probes with extra tall tips (>30 microns) for measurements on very rough surfaces and for custom applications.
Bi-modal AFM cantilevers for higher harmonic operation allow collecting information about the mechanical properties of the sample material.
Overview of all different types of AFM tips classified by shape, material and coating. Discover the available AFM tips ranging from SuperSharpSilicon AFM tips for atomic resolution AFM imaging to the robust diamond coated AFM tips with extreme durability!
Overview of the different types of AFM cantilevers classified by shape, material and coating. NanoAndMore offer everything from thin triangular silicon nitride AFM cantilevers to short megahertz silicon AFM cantilevers for high speed scanning AFM.
Overview of the different types of AFM support chips classified by lateral dimensions, thickness, material and alignment grooves.
Some special AFM probes that do not fit into the standard classification pattern such as tipless AFM cantilevers, ultra AFM cantilevers, self sensing / self actuating AFM probes, etc.