High Aspect Ratio (HAR) AFM Probes

24 results matching your criteria
AR10T-NCHR

AR10T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
AR5T-NCHR

AR5T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
NW-AR5T-NCHR

NW-AR5T-NCHR

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
TESPA-HAR

TESPA-HAR

High-Aspect-Ratio, Tapping Mode AFM Probe

Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
EBD-AR15T

EBD-AR15T

High-aspect ratio, tilt compensated EBD AFM whisker for automated non-contact AFM
Coating: none
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
Cantilever:
F 330 kHz
C 40 N/m
L 125 µm
AR10T-NCH

AR10T-NCH

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
AR5T-NCH

AR5T-NCH

High-Aspect-Ratio, Tilt Compensated Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
160AC-FG

160AC-FG

High Aspect Ratio, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: High-Aspect-Ratio
Cantilever:
F 300 kHz
C 26 N/m
L 160 µm
240AC-FG

240AC-FG

High Aspect Ratio, Force Modulation AFM Probe with Tip at the Very End of the Cantilever
Coating: Reflex (Au)
Tip Shape: High-Aspect-Ratio
Cantilever:
F 70 kHz
C 2 N/m
L 240 µm
AR10-NCHR

AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
Special Developments

Special Developments

Download a List of Non-Standard, Special AFM Probes and More
Coating: various
Tip Shape: various
AR10-NCH

AR10-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
AR5-NCHR

AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
AR5-NCH

AR5-NCH

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: none
Tip Shape: High-Aspect-Ratio
Cantilever:
F 330 kHz
C 42 N/m
L 125 µm
NW-AR10-NCHR

NW-AR10-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
NW-AR5-NCHR

NW-AR5-NCHR

High-Aspect-Ratio, Tapping Mode AFM Probe
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 320 kHz
C 42 N/m
L 125 µm
AR5-NCL

AR5-NCL

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: none
Tip Shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
AR5-NCLR

AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
NW-AR5-NCLR

NW-AR5-NCLR

High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio
Cantilever:
F 190 kHz
C 48 N/m
L 225 µm
M-CIS

M-CIS

EBD AFM whisker for non-contact AFM microlens contact image sensor (CIS) inspection
Coating: Reflex Aluminum
Tip Shape: High-Aspect-Ratio,Cone Shaped,EBD
Cantilever:
F 320 kHz
C 40 N/m
L 120 µm
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