AFM Probes » ContGB-G

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Order Code / Price*
Quantity
ContGB-G-10 Box of 10 AFM Probes
240.00 USD
Volume Discount Available [?]
ContGB-G-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 200.00 USD or 16.70%
Product availability: On stock
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ContGB-G

Gold Coated Contact Mode AFM Probe

Coating: (Au) Overall
Tip shape: Rotated
Cantilever:
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size. It is compatible with:

  • Bruker / Veeco / Digital Instruments
  • Keysight / Agilent / Molecular Imaging
  • Asylum Research
  • Park Systems
  • JEOL
  • JPK
  • etc.

Not recommended for electric applications on abrasive sample surfaces!

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.

Overall gold coating, 70 nm thick

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm (1 - 3 µm)*
  • * typical range
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