Monolithic silicon AFM probe for contact mode and lateral force mode operation.
The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.
The AFM holder chip fits most commercial AFM systems as it is industry standard size.
Not recommended for electric applications on abrasive sample surfaces!
Consistent high quality at a lower price!
This product features alignment grooves on the back side of the holder chip.