AFM Probes » ElectriCont-G

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ContE-G-10 Box of 10 AFM Probes
240.00 USD
Product availability: On stock

ElectriCont-G

Electrical, Contact Mode AFM Probe

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 13 kHz
C 0.2 N/m
L 450 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation and electric modes such as scanning capacitance microscopy (SCM).

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating. It is not designed for Conductive AFM (C-AFM).

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 0.2 N/m (0.07 - 0.4 N/m)*
  • 13 kHz (9 - 17 kHz)*
  • 450 µm (440 - 460 µm)*
  • 50 µm (45 - 55 µm)*
  • 2 µm ( 1 - 3 µm)*
  • * typical range
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