Micromachined monolithic silicon AFM probe for contact mode and lateral force microscopy (LFM) operation and electric modes such as scanning capacitance microscopy (SCM).
The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.
The AFM probe features an overall chromium-platinum coating. It is not designed for Conductive AFM (C-AFM).
With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.
Consistent high quality at a lower price!
This AFM probe features alignment grooves on the back side of the holder chip.