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ElectriMulti75-G

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Order Code / Price*
Quantity
Multi75E-G-10 Box of 10 AFM Probes
240.00 USD
Multi75E-G-50 Box of 50 AFM Probes
1050.00 USD
Your volume discount is 150.00 USD or 12.50%
Product availability: On stock

ElectriMulti75-G

best bang for your buck

Electrical, Force Modulation AFM Probe

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM Cantilever
F 75 kHz
C 3 N/m
L 225 µm
*nominal values

Applications

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Micromachined monolithic silicon AFM probe for force modulation (FM) and light tapping mode operation, and electric modes such as:

  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KPFM)
  • scanning capacitance microscopy (SCM)
  • piezoresponse force microscopy (PFM)

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This AFM probe features alignment grooves on the back side of the holder chip.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 3 N/m (1 - 7 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (23 - 33 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * typical range
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