AFM Probes » ElectriTap300-G

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Order Code / Price*
Quantity
Tap300E-G-10 Box of 10 AFM Probes
240.00 USD
Volume Discount Available [?]
Tap300E-G-50 Box of 50 AFM Probes
1 000.00 USD
Your volume discount is 200.00 USD or 16.70%
Product availability: On stock

ElectriTap300-G

Electrical, Tapping Mode AFM Probe

Manufacturer: BudgetSensors

Coating: Electrically Conductive
AFM tip shape: Rotated
AFM cantilever:
F 300 kHz
C 40 N/m
L 125 µm
*nominal values

Applications

Micromachined monolithic silicon AFM probe for high frequency non-contact and tapping mode operation, and electric modes such as:

  • electrostatic force microscopy (EFM)
  • Kelvin probe force microscopy (KPFM)
  • scanning capacitance microscopy (SCM)
  • piezoresponse force microscopy (PFM)

The consistent AFM tip radius of less than 25 nm ensures high resolution and good reproducibility. The rotated AFM tip provides more symmetric representation of high sample features.

The AFM probe features an overall chromium-platinum coating.

With its industry standard dimensions of 3.4 x 1.6 x 0.3 mm the holder chip fits most commercial AFM systems.

Consistent high quality at a lower price!

This product features alignment grooves on the back side of the holder chip.

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 40 N/m (20 - 75 N/m)*
  • 300 kHz (200 - 400 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (25 - 35 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * typical range
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