The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.
NANOSENSORS™ PPP-CONTAu AFM probes are designed for contact mode (repulsive mode) AFM imaging. This sensor can also be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimized for high sensitivity due to a low force constant.
The AFM probe offers unique features:
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
This product features alignment grooves on the back side of the holder chip.