PPP-CONTSCAu

The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape.

The NANOSENSORS™ PPP-CONTSCAu is an alternative AFM cantilever type for contact mode applications. The length of AFM cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode AFM probes for some AFM instruments. Additionally, this AFM probe type allows the application for lateral or friction force mode.

The AFM probe offers unique features:

• metallic conductivity of the AFM tip
• Au coating on both sides of the AFM cantilever
• chemically inert
• precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
• compatible with PointProbe® Plus XY-Alignment Series

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This product features alignment grooves on the back side of the holder chip.