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PPP-FMAu-10 Box of 10 AFM Probes
457.00 USD
Product availability: On stock

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values
Applications
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The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • Au coating on both sides of the AFM cantilever
  • chemically inert

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
AFM Tip:

  • AFM Cantilever:
  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * guaranteed range
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