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PPP-FMAu

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PPP-FMAu-10 Box of 10 AFM Probes

457 457.00 USD

Product availability: On stock

Side view SEM image of PointProbe® Plus AFM tip

Front view SEM image of PointProbe® Plus AFM tip

PPP-FMAu

Name: PPP-FMAu-10 Gold Coated Force Modulation AFM Probe
Brand: NANOSENSORS
SKU: PPP-FMAu-10
Price: 457 USD
Availability: InStock

Gold Coated Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard

AFM Cantilever

F 75 kHz

C 2.8 N/m

L 225 µm

*nominal values

Applications

How to optimize AFM scan parameters

The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

metallic conductivity of the AFM tip
Au coating on both sides of the AFM cantilever
chemically inert

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This AFM probe features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip:

Shape: Standard

AFM Cantilever:

Shape: Beam

Force Constant: 2.8 N/m (0.5 - 9.5 N/m)*

Resonance Frequency: 75 kHz (45 - 115 kHz)*

Length: 225 µm (215 - 235 µm)*

Width: 28 µm (20 - 35 µm)*

Thickness: 3 µm ( 2 - 4 µm)*

* guaranteed range

Interested in learning about how this AFM probe has been used by fellow researchers?

Visit the manufacturer’s website for a list of publications mentioning this AFM probe.