AFM Probes » PPP-FMAu

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PPP-FMAu-10 Box of 10 AFM Probes
384.00 USD
Product availability: On stock

PPP-FMAu

Gold Coated Force Modulation AFM Probe

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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The Point Probe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.

NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • Au coating on both sides of the AFM cantilever
  • chemically inert

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * typical range
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