The Point Probe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-FMAu is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. Furthermore non-contact or tapping mode operation is possible with the FM AFM tip but with reduced operation stability.
The AFM probe offers unique features:
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
This AFM probe features alignment grooves on the back side of the holder chip.