AFM Probes » PPP-NCLAu

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PPP-NCLAu-10 Box of 10 AFM Probes
384.00 USD
Product availability: On stock

PPP-NCLAu

Gold Coated Tapping Mode AFM Probe with Long AFM Cantilever

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard
AFM Cantilever
F 190 kHz
C 48 N/m
L 225 µm
*nominal values

Applications

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The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible AFM tip radius as well as a more defined AFM tip shape. The minimized variation in AFM tip shape provides more reproducible images.

NANOSENSORS™ PPP-NCLAu AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to NANOSENSORS™ high frequency non contact type (NCH). PPP-NCLAu is recommended if the feedback loop of the microscope does not accept high frequencies (400kHz) or if the detection system needs a minimum AFM cantilever length >125µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability. 

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • Au coating on both sides of the AFM cantilever
  • chemically inert

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 48 N/m (21 - 98 N/m)*
  • 190 kHz (146 - 236 kHz)*
  • 225 µm (215 - 235 µm)*
  • 38 µm (30 - 45 µm)*
  • 7 µm ( 6 - 8 µm)*
  • * typical range
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