The PointProbe® Plus (PPP) combines high application versatility and compatibility with most commercial SPMs. The typical AFM tip radius of less than 7 nm and the minimized variation in AFM tip shape provide reproducible images and enhanced resolution.
NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.
The AFM probe offers unique features:
Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.
This AFM probe features alignment grooves on the back side of the holder chip.