AFM Probes » PPP-NCSTAu

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PPP-NCSTAu-10 Box of 10 AFM Probes
384.00 USD
Product availability: On stock

PPP-NCSTAu

Gold Coated Soft Tapping Mode AFM Probe

Manufacturer: NANOSENSORS

Coating: Gold Overall
AFM tip shape: Standard
AFM Cantilever
F 160 kHz
C 7.4 N/m
L 150 µm
*nominal values

Applications

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The PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible AFM tip radius as well as a more defined AFM tip shape.

NANOSENSORS PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces AFM tip wear and sample wear at the same time.

The AFM probe offers unique features:

  • metallic conductivity of the AFM tip
  • Au coating on both sides of the AFM cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity

Please note: Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode.

This product features alignment grooves on the back side of the holder chip.

A metallic layer (Au) is coated on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts - the typical AFM tip radius of curvature is less than 50nm. The detector side coating enhances the reflectivity of the laser beam by a factor of 2.5 and prevents light from interfering within the AFM cantilever. The coating process is optimized for stress compensation. The bending of the AFM cantilever due to stress is less than 3.5% of the AFM cantilever length.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 7.4 N/m (1.2 - 29 N/m)*
  • 160 kHz (75 - 265 kHz)*
  • 150 µm (140 - 160 µm)*
  • 27 µm (19.5 - 34.5 µm)*
  • 2.8 µm ( 1.8 - 3.8 µm)*
  • * typical range
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