AFM Probes » PtSi-FM

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Order Code / Price*
Quantity
PtSi-FM-10 Box of 10 AFM Probes
1 481.00 USD
PtSi-FM-50 Box of 50 AFM Probes
5 846.00 USD
Your volume discount is 1 559.00 USD or 21.10%
Product availability: On stock

PtSi-FM

best of the best

Electrical, Force Modulation AFM Probes

Manufacturer: NANOSENSORS

Coating: Platinum Silicide Overall
AFM tip shape: Standard
AFM Cantilever
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

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The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. NANOSENSORS PtSi-FM AFM probes are suitable for C-AFM, Tunneling AFM, Scanning Capacitance Microscopy (SCM), Electrostatic Force Microscopy (EFM) and Kelvin Probe Force Microscopy (KFPM).

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical AFM tip radius of curvature is around 25 nm.

The AFM probe offers unique features:

  • platinum silicide coating with excellent conductivity and good wear-out behavior
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • alignment grooves on backside of silicon holder chip
  • precise alignment of the AFM cantilever position (within +/- 2 µm) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

This product features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • 2.8 N/m (0.5 - 9.5 N/m)*
  • 75 kHz (45 - 115 kHz)*
  • 225 µm (215 - 235 µm)*
  • 28 µm (20 - 35 µm)*
  • 3 µm ( 2 - 4 µm)*
  • * typical range
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