PtSi-NCH

NANOSENSORS™ PtSi-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. NANOSENSORS PtSi-NCH AFM probes are suitable for C-AFM and Tunneling AFM.

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical AFM tip radius of curvature is around 25 nm.

The AFM probe offers unique features:

• platinum silicide coating with excellent conductivity and good wear-out behavior
• chemically inert
• high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.