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Order Code / Price*
PtSi-NCH-10 Box of 10 AFM Probes
1759.00 USD
PtSi-NCH-50 Box of 50 AFM Probes
6945.00 USD
Your volume discount is 1850.00 USD or 21.00%
Product availability: On stock


Electrical, Tapping Mode AFM Probes

Manufacturer: NANOSENSORS

Coating: Platinum Silicide Overall
AFM tip shape: Standard
AFM Cantilever
F 330 kHz
C 42 N/m
L 125 µm
*nominal values
How to optimize AFM scan parameters gear icon

NANOSENSORS™ PtSi-NCH AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive AFM tip we recommend this type. NANOSENSORS PtSi-NCH AFM probes are suitable for C-AFM and Tunneling AFM.

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical AFM tip radius of curvature is around 25 nm.

The AFM probe offers unique features:

  • platinum silicide coating with excellent conductivity and good wear-out behavior
  • chemically inert
  • high mechanical Q-factor for high sensitivity

This AFM probe features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the AFM cantilever.
AFM Tip:

  • AFM Cantilever:
  • 42 N/m (10 - 130 N/m)*
  • 330 kHz (204 - 497 kHz)*
  • 125 µm (115 - 135 µm)*
  • 30 µm (22.5 - 37.5 µm)*
  • 4 µm ( 3 - 5 µm)*
  • * guaranteed range