AFM Probes » PtSi-NCH

Order Code / Price*

Quantity

PtSi-NCH-10 Box of 10 AFM Probes

1481 1 481.00 USD

Volume Discount Available [?]

PtSi-NCH-20 Box of 20 AFM Probes

2650 2 650.00 USD

Your volume discount is 312.00 USD or 10.50%

PtSi-NCH-50 Box of 50 AFM Probes

5846 5 846.00 USD

Your volume discount is 1 559.00 USD or 21.10%

Product availability: On stock

PtSi-NCH

Electrical, Tapping Mode AFM Probes

Manufacturer: NANOSENSORS

Coating: Platinum Silicide Overall
Tip shape: Standard

Cantilever:

F 330 kHz

C 42 N/m

L 125 µm

*nominal values

Applications

NANOSENSORS™ PtSi-NCH probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. NANOSENSORS PtSi-NCH probes are suitable for C-AFM and Tunneling AFM.

The Platinum Silicide coating shows an excellent conductivity (almost approaching metal conductivity). The typical tip radius of curvature is around 25 nm.

The probe offers unique features:

platinum silicide coating with excellent conductivity and good wear-out behavior
chemically inert
high mechanical Q-factor for high sensitivity

This product features alignment grooves on the back side of the holder chip.

Platinum silicide on both sides of the cantilever.

AFM Tip:

Shape: Standard

Radius: < 25 nm

AFM Cantilever:

Shape:

Force Constant: 42 N/m (10 - 130 N/m)*

Resonance Frequency: 330 kHz (204 - 497 kHz)*

Length: 125 µm (115 - 135 µm)*

Width: 30 µm (22.5 - 37.5 µm)*

Thickness: 4 µm ( 3 - 5 µm)*

* typical range

AFM Probes » PtSi-NCH

PtSi-NCH

Electrical, Tapping Mode AFM Probes