Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.
Probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and backside of the cantilever. Resulting tip radius is below 35 nm. The coating may cause cantilever bending within 3°.