AFM cantilevers of the 16 series with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM that has a low-frequency feedback loop. These AFM cantilevers also fit SPM systems that do not support AFM probes with short lever arms.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.
This AFM probe features alignment grooves on the back side of the holder chip.