AFM Probes » HQ:NSC16/Cr-Au

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HQ:NSC16/Cr-Au-15 Box of 15 AFM Probes
360.00 USD
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HQ:NSC16/Cr-Au-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC16/Cr-Au-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC16/Cr-Au

Tapping Mode AFM Probe with Gold Coated Long AFM Cantilever

Manufacturer: MikroMasch

Coating: Gold Overall
AFM tip shape: Rotated
AFM Cantilever
F 190 kHz
C 45 N/m
L 225 µm
*nominal values

Applications

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AFM cantilevers of the 16 series with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM that has a low-frequency feedback loop. These AFM cantilevers also fit SPM systems that do not support AFM probes with short lever arms.

AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.

This product features alignment grooves on the back side of the holder chip.

Cr-Au coating is formed as a 30 nm Au film with a 20 nm Cr sublayer, which is deposited for better adhesion of Au. The coating is formed on both tip side and back side of the AFM cantilever.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 45 N/m (30 - 70 N/m)*
  • 190 kHz (170 - 210 kHz)*
  • 225 µm (220 - 230 µm)*
  • 37.5 µm (34.5 - 40.5 µm)*
  • 7 µm ( 6.5 - 7.5 µm)*
  • * typical range
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