AFM cantilevers of the 18 series are optimal for Lift mode operation AFM since they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These AFM cantilevers are also used for mapping of materials properties in Force modulation mode and true topography imaging of the soft samples in Soft tapping mode.
AFM probes with overall conductive chemically inert 30 nm Au coating with 20 nm Cr sublayer on the tip and back side of the AFM cantilever. The resulting AFM probe tip radius is below 35 nm. The coating may cause AFM cantilever bending within 3°.
This AFM probe features alignment grooves on the back side of the holder chip.