AFM Probes » HQ:NSC18/Pt

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HQ:NSC18/Pt-15 Box of 15 AFM Probes
360.00 USD
Volume Discount Available [?]
HQ:NSC18/Pt-50 Box of 50 AFM Probes
900.00 USD
Your volume discount is 300.00 USD or 25.00%
HQ:NSC18/Pt-100 Box of 100 AFM Probes
1 620.00 USD
Your volume discount is 780.00 USD or 32.50%
Product availability: On stock
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HQ:NSC18/Pt

top value

Electrical, Force Modulation AFM Probe

Coating: Electrically Conductive
Tip shape: Rotated
Cantilever:
F 75 kHz
C 2.8 N/m
L 225 µm
*nominal values

Applications

Cantilevers of the 18 series are optimal for the Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in Force modulation mode and the true topography imaging of the soft samples.

Probes with overall conductive chemically inert 30 nm Pt coating on the tip and back side of the cantilever. Resulting probe tip radius is about 30 nm.

This product features alignment grooves on the back side of the holder chip.

The 30 nm conducting Pt coating is continuous from the tip end to the bulk of the Silicon chip. The coating covers both the tip and the back side.

AFM Tip:


  • AFM Cantilever:

  • Beam
  • 2.8 N/m (1.2 - 5.5 N/m)*
  • 75 kHz (60 - 90 kHz)*
  • 225 µm (220 - 230 µm)*
  • 27.5 µm (24.5 - 30.5 µm)*
  • 3 µm (2.5 - 3.5 µm)*
  • * typical range
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