By simply buying larger package sizes of Advanced Surface Microscopy, Inc. AFM probes, you automatically get a built-in quantity discount compared to the smallest packaging size.
150-2D
Calibration Specimen, 2-dimensional, 144 nm nominal period, Al on Si
Product Description
150-2D Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si Substrate: Silicon about 4x3 mm Default mounting: on 12 or 15 mm diam. steel disk
Available as a traceable calibration specimen (150-2DUTC)
Available unmounted on request.
Available mounted on SEM stub (150-2D-SEM)
Default mounting: on pin stub type A using colloidal graphite paint.
Colloidal silver paint or adhesive carbon tab available on request.
Re-Calibration traceable to National Laboratory available for $4910. Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price.
Give us your feedback
Did we miss any relevant information of this product?
Did you find this or a comparable product for a better price?
