Calibration Specimen, 2-dimensional, 144 nm nominal period, Al on Si
Calibration Specimen, 2-dimensional, 144 nm nominal period (refer to certificate for actual period), Al on Si
Silicon about 4x3 mm
on 12 or 15 mm diam. steel disk
Available as a traceable calibration specimen (150-2DUTC)
Available unmounted on request.
Available mounted on SEM stub (150-2D-SEM)
Default mounting: on pin stub type A using colloidal graphite paint.
Colloidal silver paint or adhesive carbon tab available on request.
Carbon tab not recommended for pitch < 500 nm.
See mount descriptions
traceable to National Laboratory available for $4910.
Recertification policy: we do not clean the specimens. If our inspection shows that the specimen is not in good enough condition for recertification, we will offer you a new specimen at 80% of the original price.